3 article(s) from van Dorp, Willem F
Sidewall angle tuning in focused electron beam-induced processing
- Sangeetha Hari,
- Willem F. van Dorp,
- Johannes J. L. Mulders,
- Piet H. F. Trompenaars,
- Pieter Kruit and
- Cornelis W. Hagen
Beilstein J. Nanotechnol. 2024, 15, 447–456, doi:10.3762/bjnano.15.40
The rational design of a Au(I) precursor for focused electron beam induced deposition
- Ali Marashdeh,
- Thiadrik Tiesma,
- Niels J. C. van Velzen,
- Sjoerd Harder,
- Remco W. A. Havenith,
- Jeff T. M. De Hosson and
- Willem F. van Dorp
Beilstein J. Nanotechnol. 2017, 8, 2753–2765, doi:10.3762/bjnano.8.274
The role of electron-stimulated desorption in focused electron beam induced deposition
- Willem F. van Dorp,
- Thomas W. Hansen,
- Jakob B. Wagner and
- Jeff T. M. De Hosson
Beilstein J. Nanotechnol. 2013, 4, 474–480, doi:10.3762/bjnano.4.56
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